IEC 62368-1 2018 Clause 5.3.2, V.1.5 Figure V.4 Wedge Probe
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IEC 62368-1:2018 Clause 5.3.2, V.1.5 and Figure V.4 Wedge Probe Product Information: The wedge probe conforms to the standard requirement of IEC 62368-1:2018 clause 5.3.2, 8.5.4.3, V.1.5 and figure V.4, IEC 60950-1 Fig NAF.2(S5366)and NAF.3(S5370), BS ......
Sinuo Testing Equipment Co. , Limited
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IEC 62368-1 Figure V4 Test Finger Probe Wedge Probe For Testing Document Shredders
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... to the opening: − with a force up to 45 N for a strip-cut type device; and − with a force up to 90 N for a cross-cut type device. Test Finger Probe NOTE Media destruction devices are typically identified as either...
Guangzhou HongCe Equipment Co., Ltd.
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Wedge Probe , IEC 62368-1 Figure V.4 – Wedge Probe
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...:Figure V.4 Wedge probe.pdf Packaging and Shipping 1. Aluminium box and carton box, careful and tight package, make sure the package is intact. 2. The package will be ......
KingPo Technology Development Limited
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IEC 62368 Test Probe Kits
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Product Description Consists of Five test probe: 1) Straight Unjointed Test Probes 2) Figure V.2 - Jointed Test Probe 3) Figure V.3 - Blunt Probe 4) Figure V.4 - Wedge probe 5) Diameter 1 mm, Length 20 mm Terminal Probe 1) Straight Unjointed Test Probes......
HK LEE HING INDUSTRY CO., LIMITED
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Stainless Steel IEC 62368 Figure V.5 Terminal Probe
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...Probes IEC62368 probe no. Probe Name IEC 62368 Figure V.1 Jointed test probe for equipment likely to be accessible to children IEC62368 Figure V.2 Jointed test probe for equipment like to be accessible to children IEC62368 Figure V.3 Blunt probe, Telecom Test Probe IEC62368 Figure V.4 Wedge probe IEC62368 Figure V.5 Terminal probe I) IEC 62368 Figure V.1 Jointed test probe......
Guangzhou Shice Equipment Co., Ltd.
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IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
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...wedge probe is a new accessibility probe required by the standard of IEC 60950-1 Fig NAF.2(S5366) and NAF.3(S5370) as well as BS 60950.1108/260/CD for paper shredders. It is used to test whether the hazardous parts of shredder can be touched by people. The probe......
Dongguan Kingpo Technology Limited
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80mm Blunt Probe As Per IEC 60950 IEC 60065 IEC 62368-1 For Testing TNT Circuit
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Blunt Probe as Per IEC60950, IEC60065 and IEC62368-1 for Testing TNT Circuit 1. Introduction The blunt probe is designed according to IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3, UL6500 figure B.1, IEC62368-1 figure V.3. It is applied to ......
Pego Electronics (Yi Chun) Company Limited
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IEC 60529 Jointed Test Finger Probe Stainless Steel With 50N Force
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...Probe Access Probes of IEC 60529 Jointed Test Finger With 50N Force Standard: IEC 60529 Degrees of protection provided by enclosures (IP Code) Figure 1 – Jointed test finger. IEC 61032 Protection of persons and equipment by enclosures –Probes for verification Figure 2–Test probe B. And other standard such as IEC 60335-1, IEC60884-1, IEC 60598-1, IEC60065-1, IEC 62368......
HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD
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