139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing
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...Amorphous Silicon A-Si Curved A-Si DR And Non-Destructive Testing H3543HWF-AG It is a portable wireless flat detector based on amorphous silicon surface sensor, suitable for pipeline inspection, industrial inspection, non-destructive testing and other fields Sensor Receptor Type a-Si......
HUATEC GROUP CORPORATION
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H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel
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H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel Sensor Receptor Type a-Si Scintillator Gos Active Area 350 x 430 mm Resolution 2560 x 3072 Pixel Pitch 139 μm Electricals and interface A/D Conversion 16 bits Data Interface Gigabit Ethernet/802.11ac......
HUATEC GROUP CORPORATION
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UNC Series NDT X-Ray Equipment DR with Amorphous Silicon Detector and 2600*2784*2440mm Footprint
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UNC Series NDT X-Ray Equipment (DR) Product Description: Mainly used in metal castings, hardware products, plastic products, refractory materials, resin materials, composite materials, ceramic body and welding metal parts and other small products for non-......
Unicomp Technology
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3D Imaging Detection X Ray Machine Industrial 1536*1536 Pixel Matrix
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...Non-Destructive Testing Equipment Technical Specifications X-ray Source Parameters X-ray Tube Type Closed-tube X-ray source Tube voltage range 20-160 KV Detector parameter Detector type Amorphous silicon fat panel detector Pixel size 100 μm Pixel matrix 1536*1536 Equipment Performance Parameters Details Maximum possible sample size Flat test bench 580*530mm Rotating test stand 300*300mm Rollover test......
SHENZHEN WEIMING PHOTOELECTRIC CO.,LTD.
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